EALIER RESULTS:

Our S-EBIT is running at AlbaNova. After it arrived in Stockholm April 7. quite frenetic work started to install it and some experimental set-up in the laboratory at AlbaNova. Already on Tuesday 26. we saw signal from rest gas and on Wednesday afternoon we took the first x-ray spectra and detected the first extracted ions from Ar that had been injected into the trap.

RECOMBINATION STUDIES OF HIGHLY CHARGED SI IONS AT THE STOCKHOLM ELECTRON BEAM ION TRAP

RECENT RESULTS:

The control and acquision system were improved for recombiantion measurement. The emittance for the extacted ions from S-EBIT has been measured by mounting an emittance meter. A time of flight (TOF) detector was mounted and a measurement has been done. A beam line has been built up for measurements with nanocapillaries.

ELECTRON ION COLLISION STUDIES AT THE STOCKHOLM ELECTRON BEAM ION TRAP

Recombination of highly charged silicon ions

Time-of-flight measurements

Time of Flight Spectra (left) and analyzing-magnet scan (right) for natural abundant Ne ions.

Time of flight spectra (left) and analyzing-magnet scan (right) for Ar ions.

PROPERTIES OF EXTRACTED IONS FROM THE STOCKHOLM ELECTRON BEAM ION TRAP AND THEIR APPLICATIONS

The emittance ellipse of Ar ions of 9 qkeV.

The integrals of the He- and Li-like silicon peaks in the TOF spectra are plotted against the electron energy.